From: Modelling and optimizing a system for testing electronic circuit boards
Instance identifier | Nb. of probes | Nb. of points | Nb. of tests | Nb. of nets |
---|---|---|---|---|
Dataset3 | 21 | 1034 | 2035 | 4388 |
Dataset4 | 21 | 7445 | 9832 | 19664 |
7700FC | 21 | 3016 | 4423 | 10996 |
pinPCB_15mils | 21 | 6659 | 3331 | 6659 |