From: Modelling and optimizing a system for testing electronic circuit boards
Instance | Nb. feasible tests | Real time | User time | Nb. of config. | Sol. value |
---|---|---|---|---|---|
Dataset3-90 | 1404 | 65 | 192 | 28 | 12531.5 |
Dataset3-180 | 1404 | 80 | 281 | 24 | 12927.5 |
Dataset3-270 | 1404 | 116 | 387 | 26 | 11370.3 |
Dataset4-90 | 9813 | 57 | 141 | 17 | 6887.0 |
Dataset4-180 | 9813 | 62 | 188 | 14 | 7616.6 |
Dataset4-270 | 9813 | 81 | 292 | 15 | 7016.7 |
7700FC-90 | 2855 | 89 | 139 | 20 | 9953.6 |
7700FC-180 | 2855 | 104 | 185 | 17 | 8347.6 |
7700FC-270 | 2855 | 77 | 206 | 15 | 6844.7 |
pinPCB_15mils-90 | 2360 | 60 | 103 | 13 | 6178.8 |
pinPCB_15mils-180 | 2360 | 65 | 164 | 11 | 5301.2 |
pinPCB_15mils-270 | 2360 | 81 | 261 | 11 | 5284.0 |